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Semiconductor Material and Device Characterization Wiley ~ Semiconductor Material and Device Characterization remains the sole text dedicated to characterization techniques for measuring semiconductor materials and devices Coverage includes the full range of electrical and optical characterization methods including the more specialized chemical and physical techniques
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WileyVCH Semiconductor Material and Device Characterization ~ Wiley IEEE Band Nr 1 3 Auflage Februar 2006 800 Seiten Hardcover Praktikerbuch ISBN 9780471739067 John Wiley Sons Probekapitel Kurzbeschreibung Semiconductor Material and Device Characterization is the only book on the market devoted to the characterization techniques used by the modern semiconductor industry to measure diverse semiconductor materials and devices It covers
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SEMICONDUCTOR MATERIAL AND DEVICE CHARACTERIZATION ~ SEMICONDUCTOR MATERIAL AND DEVICE CHARACTERIZATION Third Edition DIETER K SCHRODER Arizona State University Tempe AZ A JOHN WILEY SONS INC PUBLICATION
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